Measurement that goes beyond limits  

ABOUT US
DIP-View (France) is a pioneer in High Resolution Deflectometry to measure and analyze critical surfaces for Off-Line quality control and In-Line inspection applications.    

DIP-View is adressing multiple segments of the industrial markets (Automotive, Semi-conductors, Optics, ...).

Get into disruptive innovation...

Fernando MOREIRA

President

Serial entrepreneur in high tech industries - Leading International Business Development.

Alexandre ARNOULT

CTO

Phd in Physics and microelectronics, Senior Research fellow at LAAS, with a successful track record in Research to Industry technology transfers.

Bastien GRIMALDI

R&D Leader

Innovative research optical engineer, expert in optical design and instrumentation software.

High Resolution Deflectometry

High Resolution Deflectometry

Surface Inspection & Flatness measurement from Global (mm) to local (nm) inspection in one shot measurement

D-Surface View

D-Surface View

D-Surface View is intended to analyze flat surfaces up to 300-mm diameter. The equipment can be used for example for wafer surface quality control, it qualifies surface roughness, shape, flatness and topography, other applications can be automotive mirrors or optical components.

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High Accuracy and Fast 2D and 3D measurements

High Accuracy and Fast 2D and 3D measurements

2D and 3D Texture, Roughness and Waviness forms, 2D and 3D bow and shape, 2D Thin film stress, defects and 2D/3Ddefect surface mapping.

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Technical Specifications

Technical Specifications

2D and 3D step heights, 2D profiles and 3D views of the measurements, 2D and 3D roughness and waviness analysis, 2D and 3D filtering and leveling techniques, Thin film stress and sample bow calculation

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Waviness measurement

Waviness measurement

D-Surface View provides a FULL SURFACE waviness measurement in one single acquisition. Users can extract critical parameters such as Bow, Warp, TTv, LTv in a few seconds.

Roughness measurement

Roughness measurement

D-Surface View can explore roughness characteristics and detect polishing inhomogeneities or other nanometer height defects. With powerful fourrier transform filters users can visualise short frequency and high frequency defect patterns.

Large range of measurement

Large range of measurement

In one single image and pure static acquisition D-Surface View can extract from mm level down to nm level in a few seconds, users can explore the full field image at the required resolution.

  • Toulouse, Occitanie, France

Semicon Europe show - 2023

DIP-View has presented at SEMICON Europe its latest technologies for 3D wafer inspection with disruptive capabilities. A full static measurement of Bow, Warp, TTv, LTv with dual wafer side capabilities up to 300mm. From mm to nm in one single shot !

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Dip-View : a DEEPTECH Company

BPI France has recognised the highly innovative technology brought by DIP-View for the 3D surface inspection market. Dip-View is now listed as a French DEEPTECH company and will be supported by BPI French innovation organisation to grow its business.

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