Measurement that goes beyond limits
DIP-View is adressing multiple segments of the industrial markets (Automotive, Semi-conductors, Optics, ...).
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DIP-VIEW team
Fernando MOREIRA
President
Serial entrepreneur in high tech industries - Leading International Business Development.
Alexandre ARNOULT
CTO
Phd in Physics and microelectronics, Senior Research fellow at LAAS, with a successful track record in Research to Industry technology transfers.
Bastien GRIMALDI
R&D Leader
Innovative research optical engineer, expert in optical design and instrumentation software.
Technologies and Products
High Resolution Deflectometry
Surface Inspection & Flatness measurement from Global (mm) to local (nm) inspection in one shot measurement
D-Surface View
D-Surface View is intended to analyze flat surfaces up to 300-mm diameter. The equipment can be used for example for wafer surface quality control, it qualifies surface roughness, shape, flatness and topography, other applications can be automotive mirrors or optical components.
Learn MoreD-Surface View
High Accuracy and Fast 2D and 3D measurements
2D and 3D Texture, Roughness and Waviness forms, 2D and 3D bow and shape, 2D Thin film stress, defects and 2D/3Ddefect surface mapping.
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Technical Specifications
2D and 3D step heights, 2D profiles and 3D views of the measurements, 2D and 3D roughness and waviness analysis, 2D and 3D filtering and leveling techniques, Thin film stress and sample bow calculation
Learn MoreProduct Features
Waviness measurement
D-Surface View provides a FULL SURFACE waviness measurement in one single acquisition. Users can extract critical parameters such as Bow, Warp, TTv, LTv in a few seconds.
Roughness measurement
D-Surface View can explore roughness characteristics and detect polishing inhomogeneities or other nanometer height defects. With powerful fourrier transform filters users can visualise short frequency and high frequency defect patterns.
Large range of measurement
In one single image and pure static acquisition D-Surface View can extract from mm level down to nm level in a few seconds, users can explore the full field image at the required resolution.
System Partners
Contact
- Toulouse, Occitanie, France