Serial entrepreneur in high tech industries - Leading International Business Development.
Phd in Physics and microelectronics, Senior Research fellow at LAAS, with a successful track record in Research to Industry technology transfers.
Innovative research optical engineer, expert in optical design and instrumentation software.
Surface Inspection & Flatness measurement from Global (mm) to local (nm) inspection in one shot measurement
D-Surface View is intended to analyze flat surfaces up to 300-mm diameter. The equipment can be used for example for wafer surface quality control, it qualifies surface roughness, shape, flatness and topography, other applications can be automotive mirrors or optical components.Learn More
2D and 3D Texture, Roughness and Waviness forms, 2D and 3D bow and shape, 2D Thin film stress, defects and 2D/3Ddefect surface mapping.Learn More
2D and 3D step heights, 2D profiles and 3D views of the measurements, 2D and 3D roughness and waviness analysis, 2D and 3D filtering and leveling techniques, Thin film stress and sample bow calculationLearn More
D-Surface View provides a FULL SURFACE waviness measurement in one single acquisition. Users can extract critical parameters such as Bow, Warp, TTv, LTv in a few seconds.
D-Surface View can explore roughness characteristics and detect polishing inhomogeneities or other nanometer height defects. With powerful fourrier transform filters users can visualise short frequency and high frequency defect patterns.