Waviness measurement

Waviness measurement

D-Surface View provides a FULL SURFACE waviness measurement in one single acquisition. Users can extract critical parameters such as Bow, Warp, TTv, LTv in a few seconds.

Roughness measurement

Roughness measurement

D-Surface View can explore roughness characteristics and detect polishing inhomogeneities or other nanometer height defects. With powerful fourrier transform filters users can visualise short frequency and high frequency defect patterns.

Large range of measurement

Large range of measurement

In one single image and pure static acquisition D-Surface View can extract from mm level down to nm level in a few seconds, users can explore the full field image at the required resolution.